Method and apparatus for measuring a required characteristic of a workpiece layer
A Standard patent application filed on 03 December 2002 credited to Mautz, Karl

Details

Application number :

2002353024  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and apparatus for measuring a required characteristic of a workpiece layer  

Inventor :

Mautz, Karl  

Agent name :

 

Address for service :

 

Filing date :

03 December 2002  

Associated companies :

 

Applicant name :

MOTOROLA, INC.  

Applicant address :

1303 East Algonquin Road, Schaumburg, IL 60196  

Old name :

 

Original Source :

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