Implant wear debris detection apparatus and method
A Standard patent application filed on 04 April 2001 credited to Dickens Jr., Elmer D. ; Wu, Junru ; Weissman, Eric M.

Details

Application number :
2001253096  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Implant wear debris detection apparatus and method  
Inventor :
Dickens Jr., Elmer D. ; Wu, Junru ; Weissman, Eric M.  
Agent name :
 
Address for service :
 
Filing date :
04 April 2001  
Associated companies :
 
Applicant name :
Noveon IP Holdings Corp.  
Applicant address :
 
Old name :
 
Original Source :
Go  

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