Implant wear debris detection apparatus and method
A Standard patent application filed on 17 November 2000 credited to Wu, Junru ; Dickens, Elmer D. Jr. ; Weissman, Eric M.

Details

Application number :

19227  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Implant wear debris detection apparatus and method  

Inventor :

Wu, Junru ; Dickens, Elmer D. Jr. ; Weissman, Eric M.  

Agent name :

 

Address for service :

 

Filing date :

17 November 2000  

Associated companies :

 

Applicant name :

Noveon IP Holdings Corp.  

Applicant address :

 

Old name :

 

Original Source :

Go  

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