High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board
A Standard patent application filed on 28 March 2001 credited to Nakashiba, Toru ; Matsushita, Yukio ; Akamatsu, Motoyuki ; Takedomi, Masanobu ; Nagaso, Mitsuhide ; Iwaishi, Tatsumi

Details

Application number :
44588  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
High frequency circuit impedance measuring probe for inner-layer-containing laminated sheet used for multi-layer printed board  
Inventor :
Nakashiba, Toru ; Matsushita, Yukio ; Akamatsu, Motoyuki ; Takedomi, Masanobu ; Nagaso, Mitsuhide ; Iwaishi, Tatsumi  
Agent name :
 
Address for service :
 
Filing date :
28 March 2001  
Associated companies :
 
Applicant name :
Matsushita Electric Works Ltd.  
Applicant address :
 
Old name :
 
Original Source :
Go  

Same Inventor