System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern on thin film magnetic disks and silicon wafers
A Standard patent application filed on 06 October 2000 credited to Kudinar, Rusmin ; Meeks, Steven W.

Details

Application number :

79963  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern on thin film magnetic disks and silicon wafers  

Inventor :

Kudinar, Rusmin ; Meeks, Steven W.  

Agent name :

 

Address for service :

 

Filing date :

06 October 2000  

Associated companies :

 

Applicant name :

Candela Instruments  

Applicant address :

 

Old name :

 

Original Source :

Go  

Same Inventor

• System for simultaneously measuring thin film layer thickness,...