System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern

Application number :: 57809
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern
Inventor :: Kudinar, Rusmin ; Meeks, Steven W.
Agent name :
Address for service :
Filing date :: 29 June 2000
Associated companies :
Applicant name :: Candela Instruments
Applicant address :
Old name :
Original Source :: Go

System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern A Standard patent application filed on 29 June 2000 credited to Kudinar, Rusmin ; Meeks, Steven W.