Details

Application number :
2003282399  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method of fabricating semiconductor probe with resistive tip  
Inventor :
Park, Hong-Sik ; Hong, Seung-Bum ; Jung, Ju-Hwan  
Agent name :
 
Address for service :
 
Filing date :
11 November 2003  
Associated companies :
 
Applicant name :
SAMSUNG ELECTRONICS CO., LTD.  
Applicant address :
416, Maetan-dong, Yeongtong-gu, Suwon-si, Gyeonggi-do 442-742  
Old name :
 
Original Source :
Go  

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