Method of fabricating semiconductor probe with resistive tip

Application number :: 2003282399
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Method of fabricating semiconductor probe with resistive tip
Inventor :: Park, Hong-Sik ; Hong, Seung-Bum ; Jung, Ju-Hwan
Agent name :
Address for service :
Filing date :: 11 November 2003
Associated companies :
Applicant name :: SAMSUNG ELECTRONICS CO., LTD.
Applicant address :: 416, Maetan-dong, Yeongtong-gu, Suwon-si, Gyeonggi-do 442-742
Old name :
Original Source :: Go

Method of fabricating semiconductor probe with resistive tip A Standard patent application filed on 11 November 2003 credited to Park, Hong-Sik ; Hong, Seung-Bum ; Jung, Ju-Hwan