Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
A Standard patent application filed on 01 May 2003 credited to Park, Hong-Sik ; Jung, Ju-Hwan ; Shin, Hyun-Jung

Details

Application number :

2003224484  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe  

Inventor :

Park, Hong-Sik ; Jung, Ju-Hwan ; Shin, Hyun-Jung  

Agent name :

 

Address for service :

 

Filing date :

01 May 2003  

Associated companies :

 

Applicant name :

Samsung Electronics Co., Ltd  

Applicant address :

416 Maetan-dong, Yeongtong-gu Suwon-si gyeonggi-do 442-742 Republic of Korea  

Old name :

 

Original Source :

Go  

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