Analytical test device and method
A Standard patent application filed on 21 November 2003 credited to Harrington, Charles A.
;
Shi, Qinwei
;
Freitag, Helmut E.
Details
Application number :
2003262455
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Analytical test device and method
Inventor :
Harrington, Charles A.
;
Shi, Qinwei
;
Freitag, Helmut E.
Agent name :
Madderns Patent & Trade Mark Attorneys
Address for service :
GPO Box 2752 Adelaide SA 5001 Australia
Filing date :
21 November 2003
Associated companies :
Applicant name :
Spectral Diagnostics Inc
Applicant address :
135-Unit 2 The West Mall Toronto Ontario M9C 1C2 Canada