A test device and method for detecting the presence of a residue analyte in a sample
A Standard patent application filed on 16 July 1998 credited to Markovsky, Robert J. ; Boyer, Cheryl A. ; Charm, Stanley E. ; Donahue, Paul R. ; Zomer, Eliezer ; Saul, Steven J. ; Scheemaker, Joan L. ; Skiffington, Richard T. ; Trivedi, Shifali B. ; Agi-Glickman, Yael

Details

Application number :

84896  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A test device and method for detecting the presence of a residue analyte in a sample  

Inventor :

Markovsky, Robert J. ; Boyer, Cheryl A. ; Charm, Stanley E. ; Donahue, Paul R. ; Zomer, Eliezer ; Saul, Steven J. ; Scheemaker, Joan L. ; Skiffington, Richard T. ; Trivedi, Shifali B. ; Agi-Glickman, Yael  

Agent name :

 

Address for service :

 

Filing date :

16 July 1998  

Associated companies :

 

Applicant name :

Charm Sciences, Inc.  

Applicant address :

 

Old name :

 

Original Source :

Go