Device and method for scanning probe microscope
A Standard patent application filed on 24 September 2002 credited to Knebel, Detlef ; Jahnke, Torsten ; Sunwoldt, Olaf

Details

Application number :
2002339334  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Device and method for scanning probe microscope  
Inventor :
Knebel, Detlef ; Jahnke, Torsten ; Sunwoldt, Olaf  
Agent name :
 
Address for service :
 
Filing date :
24 September 2002  
Associated companies :
 
Applicant name :
JPK Instruments AG  
Applicant address :
Bouchestrasse 12, 12435 Berlin  
Old name :
 
Original Source :
Go  

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