Method and device for analysing a sample by means of a raster scanning probe microscope
A Standard patent application filed on 24 September 2002 credited to Kamps, Jorn

Details

Application number :
2002339336  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and device for analysing a sample by means of a raster scanning probe microscope  
Inventor :
Kamps, Jorn  
Agent name :
 
Address for service :
 
Filing date :
24 September 2002  
Associated companies :
 
Applicant name :
JPK INSTRUMENTS AG  
Applicant address :
Bouchestrasse 12, 12435 Berlin  
Old name :
 
Original Source :
Go  

Same Inventor