Thickness measurement system and method

Application number :: 2002308523
Application type :: Standard
Application status :: WITHDRAWN
Under opposition :: No
Proceeding type :
Invention title :: Thickness measurement system and method
Inventor :: Fry, James Ronald ; Wendt, John ; Lang, Ulrich ; Geiger, Ronald N. ; Kiernan, Stephen J. ; Spradlin, Leeman D.
Agent name :
Address for service :
Filing date :: 29 April 2002
Associated companies :
Applicant name :: AUTOMATION AND CONTROL TECHNOLOGY, INC.
Applicant address :: 650 Ackerman Road, Columbus, OH 43202-2186
Old name :
Original Source :: Go

Thickness measurement system and method A Standard patent application filed on 29 April 2002 credited to Fry, James Ronald ; Wendt, John ; Lang, Ulrich ; Geiger, Ronald N. ; Kiernan, Stephen J. ; Spradlin, Leeman D.