Method and apparatus for a waveform quality measurement
A Standard patent application filed on 13 December 2001 credited to Montojo, Juan
;
Black, Peter
;
Sindhushayana, Nagabhushana
Details
Application number :
2002228969
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
Method and apparatus for a waveform quality measurement
Inventor :
Montojo, Juan
;
Black, Peter
;
Sindhushayana, Nagabhushana
Agent name :
Madderns Patent & Trade Mark Attorneys
Address for service :
GPO Box 2752 Adelaide SA 5001 Australia
Filing date :
13 December 2001
Associated companies :
Applicant name :
Qualcomm Incorporated
Applicant address :
5775 Morehouse Drive San Diego CA 92121-1714 United States of America