A method and an apparatus for a waveform quality measurement
A Standard patent application filed on 16 January 2007 credited to Montojo, Juan
;
Black, Peter J.
;
Sindhushayana, Nagabhushana T.
Details
Application number :
2007200165
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
A method and an apparatus for a waveform quality measurement
Inventor :
Montojo, Juan
;
Black, Peter J.
;
Sindhushayana, Nagabhushana T.
Agent name :
Madderns Patent & Trade Mark Attorneys
Address for service :
GPO Box 2752 Adelaide SA 5001 Australia
Filing date :
16 January 2007
Associated companies :
Applicant name :
Qualcomm Incorporated
Applicant address :
5775 Morehouse Drive San Diego California 92121-1714 United States of America