Probe card for probing wafers with raised contact elements
A Standard patent application filed on 02 December 1999 credited to Eldridge, Benjamin N ; Mathieu, Gaetan L ; Grube, Gary W

Details

Application number :

19337  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Probe card for probing wafers with raised contact elements  

Inventor :

Eldridge, Benjamin N ; Mathieu, Gaetan L ; Grube, Gary W  

Agent name :

 

Address for service :

 

Filing date :

02 December 1999  

Associated companies :

 

Applicant name :

FormFactor, Inc.  

Applicant address :

 

Old name :

 

Original Source :

Go  

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