A nonintrusive inspection system
A Standard patent application filed on 29 November 1999 credited to Fenkart, Gerhard ; Baylis, William ; Kresse, David E. ; Mesqui, Francois A.

Details

Application number :

17473  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A nonintrusive inspection system  

Inventor :

Fenkart, Gerhard ; Baylis, William ; Kresse, David E. ; Mesqui, Francois A.  

Agent name :

 

Address for service :

 

Filing date :

29 November 1999  

Associated companies :

 

Applicant name :

Invision Technologies, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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