Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester
A Standard patent application filed on 27 March 2001 credited to Whitten, Ralph G. ; Eldridge, Benjamin N

Details

Application number :

2001249578  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and apparatus for testing signal paths between an integrated circuit wafer and a wafer tester  

Inventor :

Whitten, Ralph G. ; Eldridge, Benjamin N  

Agent name :

 

Address for service :

 

Filing date :

27 March 2001  

Associated companies :

 

Applicant name :

FormFactor, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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