System for measuring signal path resistance for an integrated circuit tester interconnect structure
A Standard patent application filed on 23 March 2001 credited to Long, John M

Details

Application number :

2001249350  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

System for measuring signal path resistance for an integrated circuit tester interconnect structure  

Inventor :

Long, John M  

Agent name :

 

Address for service :

 

Filing date :

23 March 2001  

Associated companies :

 

Applicant name :

FormFactor, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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