Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method
A Standard patent application filed on 23 January 2001 credited to Indukaev, Konstantin Vasilievich ; Andreev, Vladimir Andreevich ; Osipov, Pavel Albertovich

Details

Application number :
2001248933  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method for measuring the microrelief of an object and optical characteristics of near-surface layer, modulation interference microscope for carrying out said method  
Inventor :
Indukaev, Konstantin Vasilievich ; Andreev, Vladimir Andreevich ; Osipov, Pavel Albertovich  
Agent name :
 
Address for service :
 
Filing date :
23 January 2001  
Associated companies :
 
Applicant name :
INDUKAEV, Konstantin Vasilievich  
Applicant address :
Prospekt Mira, 52-43, Moscow  
Old name :
 
Original Source :
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