Far-field scanning apparatus and method for rapid measurement of light source characteristics with high dynamic range
A Standard patent application filed on 27 October 2000 credited to Guttman, Jeffrey L.
Details
Application number :
29040
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Far-field scanning apparatus and method for rapid measurement of light source characteristics with high dynamic range