A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method
A Standard patent application filed on 14 September 1998 credited to Hauschultz, Mikael
Details
Application number :
90632
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
A method of controlling test probes in a testing apparatus for electronic printed circuit boards, and an apparatus for performing the method