Modulation transfer function test compensation for test pattern duty cycle
A Standard patent application filed on 23 July 1998 credited to Riley, James K. ; Ortyn, William E ; Biggs, Wayne A. ; Phan, Tuan H. ; Cheng, Yu-Hui

Details

Application number :

85104  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Modulation transfer function test compensation for test pattern duty cycle  

Inventor :

Riley, James K. ; Ortyn, William E ; Biggs, Wayne A. ; Phan, Tuan H. ; Cheng, Yu-Hui  

Agent name :

 

Address for service :

 

Filing date :

23 July 1998  

Associated companies :

 

Applicant name :

NeoPath, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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