Method and apparatus for measuring temperature with an integrated circuit device
A Standard patent application filed on 14 April 1998 credited to Black, Donald Lee
;
Yones, Dale Lee
;
Pollack, Richard Stephen
;
Brown, Robert Walter
Details
Application number :
71199
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method and apparatus for measuring temperature with an integrated circuit device
Inventor :
Black, Donald Lee
;
Yones, Dale Lee
;
Pollack, Richard Stephen
;
Brown, Robert Walter