A controlled phase noise generation method for enhanced testability of clock anddata generator and recovery circuits
A Standard patent application filed on 27 March 1998 credited to Bosnyak, Robert J. ; Drost, Robert J.

Details

Application number :

65886  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A controlled phase noise generation method for enhanced testability of clock anddata generator and recovery circuits  

Inventor :

Bosnyak, Robert J. ; Drost, Robert J.  

Agent name :

 

Address for service :

 

Filing date :

27 March 1998  

Associated companies :

 

Applicant name :

Sun Microsystems, Inc.  

Applicant address :

 

Old name :

 

Original Source :

Go  

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