Method and device for measuring and quantifying surface defects on a test surface
A Standard patent application filed on 10 February 1998 credited to Larsson, Peter
;
Max, Erland
;
Larsson, Anders
Details
Application number :
62334
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method and device for measuring and quantifying surface defects on a test surface