Contact probe assembly for testing electrical devices
A Standard patent application filed on 08 January 1998 credited to Nguyen, Loi ; Nguyen, Peter Hoang

Details

Application number :

59128  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Contact probe assembly for testing electrical devices  

Inventor :

Nguyen, Loi ; Nguyen, Peter Hoang  

Agent name :

 

Address for service :

 

Filing date :

08 January 1998  

Associated companies :

 

Applicant name :

Nguyen, Peter Hoang  

Applicant address :

 

Old name :

 

Original Source :

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