Improved thickness monitoring
A Standard patent application filed on 11 August 1997 credited to Holbrook, Mark Burton ; Wilkinson, Christopher David Wicks ; Hicks, Simon Eric ; Beckmann, William George

Details

Application number :

38568  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Improved thickness monitoring  

Inventor :

Holbrook, Mark Burton ; Wilkinson, Christopher David Wicks ; Hicks, Simon Eric ; Beckmann, William George  

Agent name :

 

Address for service :

 

Filing date :

11 August 1997  

Associated companies :

 

Applicant name :

Vorgem Limited  

Applicant address :

 

Old name :

 

Original Source :

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