Method and device for measuring reflected optical radiation
A Standard patent application filed on 30 April 1997 credited to Hebert, Raymond T.
;
Widunas, Joseph T.
;
Blatt, Joel M.
Details
Application number :
28189
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
Method and device for measuring reflected optical radiation
Inventor :
Hebert, Raymond T.
;
Widunas, Joseph T.
;
Blatt, Joel M.
Agent name :
Shelston IP
Address for service :
Level 21 60 Margaret Street SYDNEY NSW 2000
Filing date :
30 April 1997
Associated companies :
Applicant name :
Metrika, Inc.
Applicant address :
510 Oakmead Parkway Sunnyvale CA 94086 United States Of America