Astigmatism measurement apparatus and method
A Standard patent application filed on 18 October 1996 credited to Riley, James K.
;
Frost, Keith L
;
Stephanick, James A
;
Hansen, Kim J.
;
Phan, Tuan
;
Lindow, William C.
Details
Application number :
74583
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
Astigmatism measurement apparatus and method
Inventor :
Riley, James K.
;
Frost, Keith L
;
Stephanick, James A
;
Hansen, Kim J.
;
Phan, Tuan
;
Lindow, William C.
Agent name :
Shelston IP
Address for service :
Level 21 60 Margaret Street SYDNEY NSW 2000
Filing date :
18 October 1996
Associated companies :
Applicant name :
NeoPath, Inc.
Applicant address :
8271 154th Avenue N.E. Redmond WA 98052 United States Of America