Robustness of classification measurement apparatus and method
A Standard patent application filed on 24 July 1996 credited to Lee, Shih-Jong J
;
Wilhelm, Paul S
;
Kuan, Chih-Chau
;
Meyer, Michael G
Details
Application number :
68987
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
Robustness of classification measurement apparatus and method
Inventor :
Lee, Shih-Jong J
;
Wilhelm, Paul S
;
Kuan, Chih-Chau
;
Meyer, Michael G
Agent name :
Shelston IP
Address for service :
Level 21 60 Margaret Street SYDNEY NSW 2000
Filing date :
24 July 1996
Associated companies :
Applicant name :
NeoPath, Inc.
Applicant address :
8271 154th Avenue N.E. Redmond WA 98052 United States Of America