Enhancement of measurement accuracy in bulk material analyzer
A Standard patent application filed on 08 July 1994 credited to Atwell, Thomas L.
;
Proctor, Raymond J.
;
Smith, Andrew H
;
Isaacson, Chris A.
;
Shyu, Chaur-Ming
Details
Application number :
67370
Application type :
Standard
Application status :
WITHDRAWN
Under opposition :
No
Proceeding type :
Invention title :
Enhancement of measurement accuracy in bulk material analyzer
Inventor :
Atwell, Thomas L.
;
Proctor, Raymond J.
;
Smith, Andrew H
;
Isaacson, Chris A.
;
Shyu, Chaur-Ming
Agent name :
Madderns
Address for service :
GPO Box 2752 ADELAIDE SA 5001
Filing date :
08 July 1994
Associated companies :
Applicant name :
Gamma-Metrics
Applicant address :
5788 Pacific Center Boulevard San Diego California 92121 United States Of America