Wafer level burn-in and electrical test system and method
A Standard patent application filed on 13 July 2000 credited to Richmond, Donald Paul II ; Lobacz, Jerzy ; Hoang, John Dinh

Details

Application number :

73292  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Wafer level burn-in and electrical test system and method  

Inventor :

Richmond, Donald Paul II ; Lobacz, Jerzy ; Hoang, John Dinh  

Agent name :

 

Address for service :

 

Filing date :

13 July 2000  

Associated companies :

 

Applicant name :

Aehr Test Systems Inc.  

Applicant address :

 

Old name :

 

Original Source :

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