Measurement of solid particle concentration in presence of a second particle type
A Standard patent application filed on 23 July 1990 credited to Kennedy, Max J. ; Stephanopoulos, Gregory N. ; Wang, Daniel C

Details

Application number :

60594  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Measurement of solid particle concentration in presence of a second particle type  

Inventor :

Kennedy, Max J. ; Stephanopoulos, Gregory N. ; Wang, Daniel C  

Agent name :

 

Address for service :

 

Filing date :

23 July 1990  

Associated companies :

 

Applicant name :

Massachusetts Institute of Technology  

Applicant address :

 

Old name :

 

Original Source :

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