Method and apparatus for determining phase shifts and trim masks for an integrated circuit
A Standard patent application filed on 28 July 2000 credited to Sakajiri, Kyohei
;
Cobb, Nicolas Bailey
Details
Application number :
63887
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method and apparatus for determining phase shifts and trim masks for an integrated circuit