Analytical test device and the use thereof
A Standard patent application filed on 09 October 1989 credited to Adler, Stanford L. ; Leong, Koon-Wah ; Campisi, John

Details

Application number :

42697  

Application type :

Standard  

Application status :

CEASED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Analytical test device and the use thereof  

Inventor :

Adler, Stanford L. ; Leong, Koon-Wah ; Campisi, John  

Agent name :

Shelston IP  

Address for service :

Level 21 60 Margaret Street SYDNEY NSW 2000  

Filing date :

09 October 1989  

Associated companies :

 

Applicant name :

Technicon Instruments Corportion  

Applicant address :

511 Benedict Avenue, Tarrytown, New York 10591-5097, United States of America  

Old name :

 

Original Source :

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