Automatic test equipment for integrated circuits

Application number :: 80750
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Automatic test equipment for integrated circuits
Inventor :: Yeung, Paul K. ; Pennock, James L. ; Hoo, James W. ; Howard, Alan D.
Agent name :
Address for service :
Filing date :: 23 September 1987
Associated companies :
Applicant name :: Huntron Instruments Inc.
Applicant address :
Old name :
Original Source :: Go

Automatic test equipment for integrated circuits A Standard patent application filed on 23 September 1987 credited to Yeung, Paul K. ; Pennock, James L. ; Hoo, James W. ; Howard, Alan D.