Method of imaging resist patterns of high resolution on the surface of a conductor
A Standard patent application filed on 14 November 1986 credited to Santos, Abelardo Montojo ; Schmidt, Gary William ; Calabrese, Peter Joseph ; Bujese, David Patrick

Details

Application number :

65148  

Application type :

Standard  

Application status :

CEASED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method of imaging resist patterns of high resolution on the surface of a conductor  

Inventor :

Santos, Abelardo Montojo ; Schmidt, Gary William ; Calabrese, Peter Joseph ; Bujese, David Patrick  

Agent name :

PHILLIPS ORMONDE FITZPATRICK  

Address for service :

367 Collins Street MELBOURNE VIC 3000  

Filing date :

14 November 1986  

Associated companies :

 

Applicant name :

Olin Hunt Specialty Products Inc.  

Applicant address :

350 Knotter Drive Cheshire, Connecticut 06410-0586 United States of America  

Old name :

 

Original Source :

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