Method of imaging resist patterns of high resolution on the surface of a conductor
A Standard patent application filed on 14 November 1986 credited to Santos, Abelardo Montojo
;
Schmidt, Gary William
;
Calabrese, Peter Joseph
;
Bujese, David Patrick
Details
Application number :
65148
Application type :
Standard
Application status :
CEASED
Under opposition :
No
Proceeding type :
Invention title :
Method of imaging resist patterns of high resolution on the surface of a conductor
Inventor :
Santos, Abelardo Montojo
;
Schmidt, Gary William
;
Calabrese, Peter Joseph
;
Bujese, David Patrick
Agent name :
PHILLIPS ORMONDE FITZPATRICK
Address for service :
367 Collins Street MELBOURNE VIC 3000
Filing date :
14 November 1986
Associated companies :
Applicant name :
Olin Hunt Specialty Products Inc.
Applicant address :
350 Knotter Drive Cheshire, Connecticut 06410-0586 United States of America