Process for removing systematic error and outlier data and for estimating randomerror in chemical and biological assays
A Standard patent application filed on 19 June 2000 credited to Ramm, Peter ; Shi, Peide ; Nadon, Robert

Details

Application number :

50967  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Process for removing systematic error and outlier data and for estimating randomerror in chemical and biological assays  

Inventor :

Ramm, Peter ; Shi, Peide ; Nadon, Robert  

Agent name :

 

Address for service :

 

Filing date :

19 June 2000  

Associated companies :

 

Applicant name :

Imaging Research, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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