Self-restoring single event upset (seu) hardened multiport memory cell
A Standard patent application filed on 15 May 2000 credited to Li, Bin ; Zien, Livia ; Hoang, Tri ; Butts, Tatia ; Lawson, David

Details

Application number :

50102  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Self-restoring single event upset (seu) hardened multiport memory cell  

Inventor :

Li, Bin ; Zien, Livia ; Hoang, Tri ; Butts, Tatia ; Lawson, David  

Agent name :

 

Address for service :

 

Filing date :

15 May 2000  

Associated companies :

 

Applicant name :

Lockheed Martin Corporation  

Applicant address :

 

Old name :

 

Original Source :

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