Details
- Application number :
- 50000
- Application type :
- Standard
- Application status :
- LAPSED
- Under opposition :
- No
- Proceeding type :
-
- Invention title :
- Non-destructive testing of hidden flaws
- Inventor :
- Dunn, William L.
- Agent name :
-
- Address for service :
-
- Filing date :
- 10 May 2000
- Associated companies :
-
- Applicant name :
- Scannex Technologies, LLC
- Applicant address :
-
- Old name :
-
- Original Source :
- Go