Method and apparatus for testing an impedance-controlled input/output (i/o) buffer in a highly efficient manner
A Standard patent application filed on 16 May 2000 credited to Le, Thomas ; Elachkar, Samir M.

Details

Application number :

48537  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method and apparatus for testing an impedance-controlled input/output (i/o) buffer in a highly efficient manner  

Inventor :

Le, Thomas ; Elachkar, Samir M.  

Agent name :

 

Address for service :

 

Filing date :

16 May 2000  

Associated companies :

 

Applicant name :

Sun Microsystems, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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