Apparatus and method for measuring decay in intensity of electromagnetic radiation in multipass spectrometry
A Standard patent application filed on 14 April 2000 credited to Smith, Alan Joseph

Details

Application number :

45798  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Apparatus and method for measuring decay in intensity of electromagnetic radiation in multipass spectrometry  

Inventor :

Smith, Alan Joseph  

Agent name :

 

Address for service :

 

Filing date :

14 April 2000  

Associated companies :

 

Applicant name :

Shimadzu Research Laboratory (Europe) Ltd  

Applicant address :

 

Old name :

 

Original Source :

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