A method to identify disease resistant quantitative trait loci in soybean and compositions thereof
A Standard patent application filed on 24 May 2007 credited to Xie, Chongqing
;
Butruille, David Vincent
;
Baley, George James
;
Narvel, James
;
Tamulonis, John
;
Kruger, Warren M.
;
Pitkin, John W.
;
Haverdink, Michael D.
;
Eathington, Samuel R.
;
Concibido, Vergel C.
;
Ledeaux, John Robert
Details
Application number :
2007314556
Application type :
Standard
Application status :
FILED
Under opposition :
No
Proceeding type :
Invention title :
A method to identify disease resistant quantitative trait loci in soybean and compositions thereof
Inventor :
Xie, Chongqing
;
Butruille, David Vincent
;
Baley, George James
;
Narvel, James
;
Tamulonis, John
;
Kruger, Warren M.
;
Pitkin, John W.
;
Haverdink, Michael D.
;
Eathington, Samuel R.
;
Concibido, Vergel C.
;
Ledeaux, John Robert
Agent name :
EF WELLINGTON & CO
Address for service :
312 St. Kilda Road Southbank Melbourne VIC 3006 Australia
Filing date :
24 May 2007
Associated companies :
Applicant name :
MONSANTO TECHNOLOGY LLC
Applicant address :
800 North Lindbergh Boulevard St. Louis MO 63167 United States of America