Correction of measurements with sensors affected by several properties of a material
A Standard patent application filed on 12 April 2000 credited to Chase, Lee ; Goss, John D. ; Yu, Raymond ; Clarke, Martin G. ; Walford, Graham V. ; Hagart-Alexander, Chase

Details

Application number :

43441  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Correction of measurements with sensors affected by several properties of a material  

Inventor :

Chase, Lee ; Goss, John D. ; Yu, Raymond ; Clarke, Martin G. ; Walford, Graham V. ; Hagart-Alexander, Chase  

Agent name :

 

Address for service :

 

Filing date :

12 April 2000  

Associated companies :

 

Applicant name :

Honeywell Inc.  

Applicant address :

 

Old name :

 

Original Source :

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