On-line measurement and control of polymer properties by raman spectroscopy
A Standard patent application filed on 08 May 2003 credited to Morrow, David
;
Yahn, David A.
;
Andrews, Timothy J.
;
Impelman, Ryan W.
;
Chang, Shih Y.
;
Long, Robert L.
Details
Application number :
2003304552
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
On-line measurement and control of polymer properties by raman spectroscopy
Inventor :
Morrow, David
;
Yahn, David A.
;
Andrews, Timothy J.
;
Impelman, Ryan W.
;
Chang, Shih Y.
;
Long, Robert L.