Diagnosis of fragile plaque by active temperature-measurement
A Standard patent application filed on 28 November 2003 credited to Ohmori, Sayaka ; Arai, Tsunenori ; Yanagihara, Takeshi

Details

Application number :
2003304154  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Diagnosis of fragile plaque by active temperature-measurement  
Inventor :
Ohmori, Sayaka ; Arai, Tsunenori ; Yanagihara, Takeshi  
Agent name :
 
Address for service :
 
Filing date :
28 November 2003  
Associated companies :
 
Applicant name :
KEIO UNIVERSITY  
Applicant address :
15-45, Mita 2-chome, Minato-ku, Tokyo 108-8345  
Old name :
 
Original Source :
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Same Inventor