Method of determining properties of patterned thin film metal structures using transient thermal response
A Standard patent application filed on 10 December 2003 credited to Gostein, Michael ; Maznev, Alexei

Details

Application number :

2003302975  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method of determining properties of patterned thin film metal structures using transient thermal response  

Inventor :

Gostein, Michael ; Maznev, Alexei  

Agent name :

 

Address for service :

 

Filing date :

10 December 2003  

Associated companies :

 

Applicant name :

KONINKLIJKE PHILIPS ELECTRONICS N.V.  

Applicant address :

Groenewoudseweg 1, NL-5621 BA Eindhoven  

Old name :

 

Original Source :

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