Scanning electron microscope having multiple detectors and a method for multiple detector based imaging
A Standard patent application filed on 22 October 2003 credited to Adamec, Pavel ; Shemesh, Dror

Details

Application number :

2003284339  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Scanning electron microscope having multiple detectors and a method for multiple detector based imaging  

Inventor :

Adamec, Pavel ; Shemesh, Dror  

Agent name :

 

Address for service :

 

Filing date :

22 October 2003  

Associated companies :

 

Applicant name :

APPLIED MATERIALS ISRAEL, LTD.  

Applicant address :

8 Oppenheimer Street, 76236 Rehovot  

Old name :

 

Original Source :

Go