Optical inspection system and radiation source for use therein
A Standard patent application filed on 26 November 2003 credited to Van Den Brandt, Adrianus H. J. ; Engeln, Richard A. H. ; Haverlag, Marco ; Schram, Daniel C.

Details

Application number :

2003283767  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Optical inspection system and radiation source for use therein  

Inventor :

Van Den Brandt, Adrianus H. J. ; Engeln, Richard A. H. ; Haverlag, Marco ; Schram, Daniel C.  

Agent name :

 

Address for service :

 

Filing date :

26 November 2003  

Associated companies :

 

Applicant name :

KONINKLIJKE PHILIPS ELECTRONICS N.V.  

Applicant address :

Groenewoudseweg 1, NL-5621 BA Eindhoven  

Old name :

 

Original Source :

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